Elettra experimental data: LEED, STM and Photoemission of Si(110)

Published: 22 March 2019| Version 1 | DOI: 10.17632/ts3284gvw5.1
Nathan Lewis,


The data here corresponds to spin- and angle-resolved photoemission measurements obtained over the course of three beamruns at the APE-LE beamline of the Elettra synchrotron. The data is grouped into the three different beamruns and corresponding excel documents are used to identify the parameters that were used to collect the data for a single set of measurements. Corresponding, STM and LEED patterns are also shown for the appropriate beamruns.


Steps to reproduce

All LEED.rar parts must be all be selected before extraction.


The University of Manchester, Elettra Sincrotrone Trieste SCpA, Cockcroft Institute


Angle-Resolved Photoemission Spectroscopy, Photoemission Spectroscopy