Data used in the simultaneous analysis of electrical characteristics and microstructure of crystallised PEDOT:PSS based OECTs under strain

Published: 14-01-2021| Version 1 | DOI: 10.17632/v5y3bjw9b6.1
Contributor:
Joseph Troughton

Description

All data refer to measurements carried out on PEDOT:PSS OECTs, see the associated research article and data paper for further details. Dataset 1 contains the Raw NEXUS format data files collected from the DiffAbs beamline while performing GIWAXS measurements. It contains data for the two OECT devices used, along with the same data collected for comparative samples of polyurethane (PU), Parylene C (PaC) coated PU, and glass coated with the PEDOT:PSS mixture with and without acid treatment. Also included are two flat scans performed without any samples in order to correct for non-uniform pixel response in the XPAD, and orientation of the beam, sample, and detector, as described elsewhere. For the two OECT devices tested (Devices A and B), the file name indicates the percentage strain applied during each measurement. Dataset 2 contains the qz projection of all the GIWAXS measurements contained in Dataset 1, after performing the correction mentioned using the two flat scans. Each GIWAXS dataset is labelled in the same fashion as in dataset 1. These data are used for the fitting and analysis in the related paper “Simultaneous measurement of electrical characteristics and microstructure of crystallised PEDOT:PSS based OECTs under strain”. Dataset 3 contains the raw electrical measurements performed on the two OECT devices for each percentage strain.

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