Nanoscale Residual Stress Depth Profiling by Focused Ion Beam Milling and Eigenstrain Analysis

Published: 20 February 2018| Version 1 | DOI: 10.17632/vb78jgkw4z.1
Contributors:
Alexander Korsunsky,
Enrico Salvati,
Marco Sebastiani,
Zeeshan Mughal

Description

FIB-DIC multiple micro-ring-core milling strain data

Files

Steps to reproduce

refer to paper