Nanoscale Residual Stress Depth Profiling by Focused Ion Beam Milling and Eigenstrain Analysis

Published: 20 February 2018| Version 1 | DOI: 10.17632/vb78jgkw4z.1
Contributors:
Alexander Korsunsky,
,
,

Description

FIB-DIC multiple micro-ring-core milling strain data

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Steps to reproduce

refer to paper

Categories

Materials Science, Microscopy, Electron Microscopy, Finite Element Modeling, Surface Engineering, Residual Stress, Focused Ion Beam

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