FIELD AGED PHOTOVOLTAIC CONNECTOR TESTING

Published: 9 February 2024| Version 2 | DOI: 10.17632/y4c8pw8f5n.2
Contributor:
kartik kapoor

Description

The data includes 3 subsets of files containing General Testing, Thermal cycle testing and damp heat testing results. The first file consists of general testing which were performed on 27 connectors in a laboratory, including contact resistance, dielectric voltage, insulation resistance IP, and glow wire test. As the connectors had different lengths of 4 sq mm cables, the contact resistance of the whole sample was first measured and then the cable resistance was subtracted from the initial value to get the contact resistance of the connector. The second file consists of thermal cycling tests where a separate set of 16 connector samples comprising of control and field-aged connectors is subjected to a thermal cycling test for 1000 hrs with 200 cycles as per laid out norms where the connector is subjected to repeated cycles of temperatures of -40 to 105 °C. After every 100 cycles, the contact resistance of connectors is measured and finally, the dielectric strength test and IP test are conducted followed by the contact resistance test. Finally, the glow wire test is conducted on the samples. The connector is then examined for signs of damage or degradation, such as corrosion or changes in material properties after this test. The third file consists of Damp heat testing where a separate set of 14 control and field-aged connectors for 7 cycles for a total of 1416 hrs though the standard norms specify only 1000 hrs. However, more stress was put on to the connectors for establishing a pattern of failure. In each cycle, the connector is exposed to a continuous temperature of 85C and 85% humidity environment, and again after each cycle, the contact resistance test is repeated followed by tests as mentioned in thermal cycling after the termination of damp heat testing. After this test, the connector is examined for any signs of damage or degradation, such as corrosion or changes in material properties.

Files

Institutions

Shri Mata Vaishno Devi University

Categories

Thermal Cycling, Contact Resistance, Photovoltaic Component

Licence