Piezoelectric measurements for the verification of piezoelectric algorithms
Description
This repository contains data gathered from a series of tests conducted on piezoelectric stacks made out of plates manufactured by THORLABS company. Plates used for the experiment are marked as PA4HEW and PA4FEW. The data was aggregated using the added Aggregator.mlx Matlab script to make the data easily readable in the form of a graph of relation between registered displacement and modulation signal frequency.
Files
Steps to reproduce
The test was conducted using Polytec's laser interferometer designated OFV2570/OFV574. To generate the modulated current, a WW5064 generator was used, manufactured by Tabor Electronics. The signal was amplified with Tegam 2340 signal amplifier. The data was recorded with Rigol DS1064B Oscilloscope. All tested plates were joined using cyanoacrylate glue. Stacks were attached to a granite block from one side. The measured side was free and a reflective patch was placed to reflect the laser from it. The oscilloscope input had an impedance of 1 MΩ, therefore the recorded signal from the vibrometer corresponded to the ratio of 50 nm/V. Samples were recorded every 0.8 µs, obtaining a measurement resolution of 1.25 MHz and a measurement length of 6.5536 ms. Signals were sampled with a maximum frequency of 350 kHz, so the Nyquist frequency was not exceeded. In the study, it was possible to set a higher measurement resolution, but due to the limited readability of the oscilloscope display at higher measurement resolutions, a decision was made to stay at the sampling frequency of 1.25 MHz. The voltage of the amplified signal was set to 1V because of the Polytec's measurement limitation of only 75nm in the direct displacement measurement loop.