A C++ code for simulations of RHEED intensity oscillations within the kinematical approximation
This paper proposes a new software implementation for the rapid development and deployment of computer simulations of reflection high-energy electron diffraction (RHEED) intensity oscillations during the growth of thin epitaxial films. The calculations are based on the kinematical approximation. In this model the RHEED intensity oscillations from growing layers is considered as an effect of changes of surface roughness. The previous version of this program (ADVL) may be found at https://doi.org/10.1016/j.cpc.2005.04.005.