Slit height smearing correction in small angle X-ray scattering II: Computation of the correction function

Published: 1 January 1979| Version 1 | DOI: 10.17632/zm5wtyzgmt.1
Moshe Deutsch


Title of program: FFITEX Catalogue Id: AASC_v1_0 Nature of problem The author's exact solution of the slit height smearing problem in small angle X-ray scattering and its implementation, require the use of a correction function g(t) in the correction formula. The parameters defining this function are obtained by fitting an appropriate analytic form to the measured values of the transmission function f(t) of the slit system used in the scattering experiment. The present program performs the required fit and calculates the fit parameters. Versions of this program held in the CPC repository in Mendeley Data AASC_v1_0; FFITEX; 10.1016/0010-4655(79)90096-1 This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2018)



Crystallography, Computational Physics