Data for: Insights into intragranular precipitation and toughening effect of W in (Ti, W)C solid solution with TiH2 as the inducer

Published: 4 September 2019| Version 1 | DOI: 10.17632/zsc6wrskxg.1
Contributors:
Lei Chen,
jia peng,
Yujin Wang

Description

Fig. 1 XRD patterns (A) in a 2θ range of 30 to 80o and enlarged patterns (B) in a 2θ range of 70 to 80o for a) (Ti,W)C powder, b) (Ti,W)C ceramic and c-g) (Ti,W)C-W composites sintered at different temperatures of 1300 oC, 1400 oC, 1500 oC, 1600 oC and 1700 oC, respectively. Fig. 2 SEM images of (Ti,W)C-W composites obtained at different temperatures a) 1300 oC, b) 1400 oC, c) 1500 oC, d) 1600 oC, e)1700 oC, and f) (Ti,W)C solid solution ceramic sintered at 1700 oC. Fig. 3 TEM morphology of (Ti,W)C-W composite fabricated at 1700 oC for 1 h: a) TEM morphology, b) HRTEM image of the interface between the matrix and the precipitation corresponding to zone 3, c) selected area electron diffraction pattern (SAED) of zone 1, d) selected area electron diffraction pattern (SAED) of zone 2 and e) EDS analyses of zone 1 and zone 2 Fig. 4 SEM morphologies of the cross-section showing the interface beween (Ti, W)C solid solution and Ti bulk after heating at 1500 oC for 60min: a) cross section; b–d) enlarged views of different regions of zone 2, zone 5 and the whole interface from zone 1 to zone 5, respectively. Fig. 5 Interfacial morphologies and line scan analyses of Ti, W and C across the interface from (Ti, W)C solid solution to Ti bulk after heat treatment at 1500 oC for 60 min. Fig. 6 Elemental distribution mapping of C, W and Ti across the interface between (Ti, W)C and Ti. Fig. 7 XRD pattern of interface between (Ti, W)C solid solution and Ti bulk. Fig. 8 The cross-section showing the interface between (Ti,W)C solid solution and Ti bulk after heat treatment at 1500 oC and 1800 oC Fig. 9 A simplified schematic of precipitation process in (Ti, W)C-W composite

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Scanning Electron Microscopy, Diffusion, Electron Probe Microanalyzer, X-Ray Diffraction, Transmission Electron Microscopy, Energy-Dispersive X-Ray Spectroscopy

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