Scripta Materialia

Data set of small angle X-ray scattering after processing, presenting the evolution of the mean radius and an approximation of the volume fraction of preciptates (which one is calculated under the assumption detailed in the article). Transmission electron microscopy data from image analysis are also given.

The variation of the current density and electrical conductivity with time

These are original pictures used in this paper

Summary This is a 4D scanning transmission electron microscopy (4D STEM) dataset collected in near-parallel beam mode (NBED) from a sample of ion irradiated austenitic (FCC) stainless steel of the DIN 1.4970 specification, collected on a high quality pixelated detector inside a transmission electron microscope (TEM). The dataset is represented by a 4D array, comprising a 2D grid of scan points, with each scan point mapping to an electron diffraction spot pattern. From this kind of dataset it is possible to derive local crystal orientations and strains. The dataset is in the .hspy format, the native hdf5 format of the HyperSpy library. The main features in this dataset are: a single crystal of the matrix is sampled, close to a 110 zone axis inside the matrix, irradiation induced G-phase precipitates of 10-20 nm in size can be found which contribute weakly to some of the diffraction patterns. From these patterns it is possible to derive the orientation relationship of the precipitates with respect to the matrix. irradiation also resulted in the formation of faulted frank loops, which also show up in some diffraction patterns. Material and sample preparation The sample was prepared from DIN 1.4970 steel (composition by weight: 15% Ni, 15% Cr, 1.8% Mn, 1.2% Mo, 0.5% Ti, 0.5% Si, 0.1% C, Fe Bal.) with the intended application of nuclear fuel cladding material. The material was originally in the shape of thin walled tubes and cold worked to 24% (measured by cross sectional area reduction). The material was aged for 2 hours at 800 °C. It was then irradiated to 40 dpa surface damage as calculated using the SRIM program and the Kinchin and Pease model with displacement energy of 40 eV, using 4.5 MeV Fe2+ ions with a flux of arround 9x1011 ions.s-1.cm-2. The irradiation was performed at 600 °C. Full details on the material, irradiation conditions, and context can be found in: Cautaerts, N., Delville, R., Stergar, E., Pakarinen, J., Verwerft, M., Yang, Y., Hofer, C., Schnitzer, R., Lamm, S., Felfer, P., & Schryvers, D. (2020). The role of Ti and TiC nanoprecipitates in radiation resistant austenitic steel : A nanoscale study. Acta Materialia, 197, 184–197. https://doi.org/10.1016/j.actamat.2020.07.022 A TEM sample was prepared by regular focused ion beam (FIB) lift-out techniques in a Ga-ion FIB. Additional details on the dataset can be found in the paper and supplementary materials of Cautaerts, N., Rauch, E. F., Jeong, J., Dehm, G., & Liebscher, C. H. (2021). Investigation of the orientation relationship between nano-sized G-phase precipitates and austenite with scanning nano-beam electron diffraction using a pixelated detector. Scripta Materialia, 201, 113930. https://doi.org/10.1016/j.scriptamat.2021.113930 Microscopy parameters and data collection NBED was performed in a JEM-2200FS TEM (JEOL) operating at 200 kV. The microscope was operated in nanobeam diffraction mode with the smallest spot size (Spot 5). The probe diameter was ~ 1 nm with a semi-convergence angle of ~0.5 mrad. Data was collected on a TemCam-XF416 pixelated CMOS detector (TVIPS). The camera length as indicated in the operating software was 80 cm, and collected images were 1024 by 1024 in size (hardware binning of 4). The dataset comprises 260x200 scan points and pixel depth is 2 bytes (unsigned 16 bit integers). Data processing The raw data was collected in the .tvips format. The original dataset was about 50 GB in size and can be shared upon request to the author. This dataset was converted to the .hspy format using the TVIPSconverter tool. In the conversion, the images were binned by an additional factor of 4 to a final size of 256x256. A median filter was also applied to the data to remove pixel noise. Data characteristics Scan shape: 260 x 200 pixels Image shape: 256 x 256 pixels Pixel dtype: uint16 Scan pixel size: about 1 nm, scan dimensions were never calibrated Image pixel size: 0.01261 Angstrom-1 / pixel Note that scale factors are not stored in the dataset! The dataset can be read with HyperSpy using the load function (please see the HyperSpy documentation) and the pixel scale can be set through the axes manager. It is highly recommended to have a working installation of Pyxem as well to process the data. Additional notes Data was collected with the TVIPS scan generator which can be quite buggy. The scan lines show "jitters" due to the unstable snake-scan pattern, hysteresis and instability.

The level-cut Gaussian random field approach based on standing waves is used to generate bi-phase microstructures of arbitrary phase fraction. Finite Element voxel models based on such microstructures are employed to predict the mechanical properties of zircon (ZrSiO4) for varying degree of amporphization from 0 to 100% with percolation transitions at 15.9 and 84.1%. Between the percolation transitions, the microstructure is bi-continuous. The numerical simulations provide values for the volumetric swelling, density, Young´s modulus, Poisson´s ratio, yield stress, and hardness as function of the amorphous phase fraction. For achieving a fit with nanoindentation hardness data in the literature, the micromechanical model additionally considers an interface between the amorphous and the crystalline phase that can be adjusted in thickness. Yield stress and hardness data are predicted for different values of interface thickness. The repository contains the simulation results as well as the literature data used for comparison.

SEM EDX maps, quant and BSE, TEM HAADF, STEM EDX maps and quant, Dark field and Selected area diffraction patterns as in the publication.

XRD and HR-TEM analyses of Si-ion irradiated Zr/Nb nanoscale multilayers with different individual layer thicknesses.

Data associated with syncrotron X-ray experiments conducted to show that the unit cell of bainitic ferrite is not cubic

Atom probe tomography data from study of low-temperature bainite in as-transformed condition. Samples for examination by atom probe were prepared from alloy~A2 transformed at 473 K (12 days transformation). Fe-0.75C-1.63Si-1.95Mn-1.48Cr-0.28Mo-0.1V-<0.01Al-0.003P-0.003S wt%

The files uploaded here constitute the raw data files for the experimental results presented in the paper named above. SEM BSE images and EDX maps are provided. TEM BF images and SADPs are also provided. Some additional SEM EDX maps are given, which were not presented in the paper, that further support the statements made in the paper. The raw .dm3 picture files generated from the Osiris microscope are available. Raw INCA .ipj files are also included. Readme files are included in where appropriate. The dataset will be updated with publication details. The article associated with this dataset can be found on the Cambridge University Repository at https://www.repository.cam.ac.uk/handle/1810/251467