XPS Data fitting

Name: XPS Data fitting
Creator: Mohamed EL GARAH
Published: 2022-02-14T13:28:47.489Z
Keywords: Thin Film Characterization

EL GARAH, Mohamed; Taouaibia, Djallel Eddine; Achache, Sofiane; Michau, Alexandre; Sviridova, Elizaveta; Postnikov, Pavel S.; Chehimi, Mohamed M.; Schuster, Frederic; Sanchette, Frederic

doi:10.17632/22nygcrxth.1

XPS Data fitting

Published: 14 February 2022| Version 1 | DOI: 10.17632/22nygcrxth.1

Contributors:

, Djallel Eddine Taouaibia, Sofiane Achache, Alexandre Michau, Elizaveta Sviridova, Pavel S. Postnikov, Mohamed M. Chehimi, Frederic Schuster, Frederic Sanchette

Description

The data concerns X-ray photoelectron spectroscopy fitting of the nitrogen effect on high entropy films obtained by magnetron sputtering.

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Universite de Technologie de Troyes

XPS Data fitting

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