Data set DRX HAp
Published: 4 October 2018| Version 1 | DOI: 10.17632/4v3g9tsb2p.1
Contributor:
M. J. Robles-ÁguilaDescription
X-ray diffraction (XRD) analysis was carried out using a XRD1 beamline with detector Dectris Pilatus 2M. Data were collected at room temperature, using a monochromatic wavelength of 1 Å, with exposition time of 30 seconds. The phase composition of the samples was determined using the Powder Diffraction File PDF+4 from the ICDD (International Centre of Diffraction Data).
Files
Institutions
Elettra Sincrotrone Trieste SCpA
Categories
Synchrotron X-Ray Diffraction