Copper enrichment on aluminium surfaces after electropolishing and its effect on electron imaging and diffraction
Published: 15 October 2020| Version 1 | DOI: 10.17632/5ks69cckkp.1
Contributor:
Sigurd WennerDescription
ICPMS, SIMS, TEM, STEM and EELS data from the publication "Copper enrichment on aluminium surfaces after electropolishing and its effect on electron imaging and diffraction".
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SINTEF
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Inductively Coupled Plasma Mass Spectrometry, Transmission Electron Microscopy, Secondary Ion Mass Spectrometry