Copper enrichment on aluminium surfaces after electropolishing and its effect on electron imaging and diffraction

Published: 15 October 2020| Version 1 | DOI: 10.17632/5ks69cckkp.1
Contributor:
Sigurd Wenner

Description

ICPMS, SIMS, TEM, STEM and EELS data from the publication "Copper enrichment on aluminium surfaces after electropolishing and its effect on electron imaging and diffraction".

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Institutions

  • SINTEF

Categories

Inductively Coupled Plasma Mass Spectrometry, Transmission Electron Microscopy, Secondary Ion Mass Spectrometry

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