Data for: The band structure change of Hf0.5Zr0.5O2/Ge system upon post deposition annealing

Published: 1 June 2019| Version 1 | DOI: 10.17632/6cbrnbc3hh.1
Contributor:
Hong Dong

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All data.

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Ultraviolet Spectrophotometry, X-Ray Photoelectron Spectroscopy, Synchrotron Radiation

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