Data for: Contactless determination of base resistivity on silicon wafers with highly doped surfaces

Published: 12 June 2019| Version 1 | DOI: 10.17632/73yt7m3c8n.1
Contributor:
Hannes Hoeffler

Description

The database of the central result graph Fig. 4a) is covered by Reaserch_data_figure4a.

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Electrical Resistivity

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