Data for: Contactless determination of base resistivity on silicon wafers with highly doped surfaces

Published: 12 Jun 2019 | Version 1 | DOI: 10.17632/73yt7m3c8n.1
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Description of this data

The database of the central result graph Fig. 4a) is covered by Reaserch_data_figure4a.

Experiment data files

This data is associated with the following publication:

Contactless determination of base resistivity on silicon wafers with highly doped surfaces

Published in: Solar Energy Materials and Solar Cells

Latest version

  • Version 1

    2019-06-12

    Published: 2019-06-12

    DOI: 10.17632/73yt7m3c8n.1

    Cite this dataset

    Hoeffler, Hannes (2019), “Data for: Contactless determination of base resistivity on silicon wafers with highly doped surfaces”, Mendeley Data, v1 http://dx.doi.org/10.17632/73yt7m3c8n.1

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Categories

Electrical Resistivity

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The files associated with this dataset are licensed under a Creative Commons Attribution 4.0 International licence.

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This dataset is licensed under a Creative Commons Attribution 4.0 International licence. What does this mean? You can share, copy and modify this dataset so long as you give appropriate credit, provide a link to the CC BY license, and indicate if changes were made, but you may not do so in a way that suggests the rights holder has endorsed you or your use of the dataset. Note that further permission may be required for any content within the dataset that is identified as belonging to a third party.

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