X-ray diffraction (XRD) raw data for YIG and BiIG thin films on SiO₂/Si substrates
Description
This dataset contains raw X-ray diffraction (XRD) data for yttrium iron garnet (YIG) and bismuth iron garnet (BiIG) thin films deposited on silicon substrates with a SiO₂ buffer layer by ion-beam sputtering. Samples: BiIG-SiO2-Si(1): BiIG thin film annealed at 540 °C. YIG-SiO2-Si(3): YIG thin film annealed at 820 °C. The crystal structure was investigated by X-ray diffraction (Cu Kα radiation, Kβ filter, without a monochromator; Bragg–Brentano geometry; D/teX Ultra 250 detector; generator settings: 40 kV / 50 mA). The θ/2θ scans were performed in the 10–60° range with a step size of 0.01° and a scan speed of 5°/min. Peak positions and widths were determined by profile fitting (asymmetric pseudo-Voigt function; peak search via the second-derivative method). Interplanar spacings d were calculated using the Kα₁ line (λ = 1.5406 Å). The average size of the coherent scattering regions (CSR), which is typically associated with the crystallite size, was estimated using the Scherrer equation. The lattice parameter was calculated from the positions of the film reflections; the position of the Si substrate reflection was used to monitor the systematic shift of the 2θ scale. File formats: The files are provided in .txt