data files of characterization techniques of ZnS films.
Published: 19 April 2020| Version 1 | DOI: 10.17632/drjn5nwdm5.1
Contributor:
Joan ReyesDescription
The ZnS films were characterized by XRD, SEM, UV-VIS and photoluminescence. The data of the different techniques characterization are in opj format for easy access.
Files
Institutions
Universidad Autonoma Metropolitana Azcapotzalco
Categories
Films (Surface Science)