Data for: Measurement of the optical dielectric properties of thin-lm materials by ultrafast time-resolved interferometry

Name: Data for: Measurement of the optical dielectric properties of thin-lm materials by ultrafast time-resolved interferometry
Creator: Haiying Song
Published: 2020-02-04T23:53:40.374Z
Keywords: Data Acquisition, Sampling, Design Principle

Song, Haiying; Ge, Qi; Liu, Shi-Bing; Lu, Mei-Rong; Li, Ya-Chao; Emara, Elshaimaa; Wang, Peng

doi:10.17632/fbv9gjdxn3.1

Data for: Measurement of the optical dielectric properties of thin-lm materials by ultrafast time-resolved interferometry

Published: 04-02-2020| Version 1 | DOI: 10.17632/fbv9gjdxn3.1

Contributors:

Haiying Song,

Qi Ge,

Shi-Bing Liu,

Mei-Rong Lu,

Ya-Chao Li,

Elshaimaa Emara,

Peng Wang

Description

these are the principle, the sample in the expriment used in this article and the data processing, also the set-up used in this expriment

Data for: Measurement of the optical dielectric properties of thin- lm materials by ultrafast time-resolved interferometry

Description

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Data for: Measurement of the optical dielectric properties of thin-lm materials by ultrafast time-resolved interferometry