Data for: Measurement of the optical dielectric properties of thin- lm materials by ultrafast time-resolved interferometry

Published: 4 February 2020| Version 1 | DOI: 10.17632/fbv9gjdxn3.1
Contributors:
Haiying Song, Qi Ge, Shi-Bing Liu, Mei-Rong Lu, Ya-Chao Li, Elshaimaa Emara, Peng Wang

Description

these are the principle, the sample in the expriment used in this article and the data processing, also the set-up used in this expriment

Files

Categories

Data Acquisition, Sampling, Design Principle

Licence