Digital Circuits Reliability (DCR)

Published: 23 July 2026| Version 1 | DOI: 10.17632/g67pk2k3hc.1
Contributor:
somayeh bahramnejad

Description

This is a dataset including different parameters affected on digital circuits reliability and the calculated reliability of the circuit based on the parameters' condition. The dataset is generated from the following research: Somayeh Bahramnejad, "A fuzzy-arithmetic-based reliability assessment model for digital circuits (FARAM-DC)," Microelectronics Reliability, Volume 174, 2025, https://doi.org/10.1016/j.microrel.2025.115893.

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Categories

Reliability Analysis, Machine Learning, Digital Circuit

Related Links

Article
https://www.sciencedirect.com/science/article/pii/S0026271425003063
is source of this dataset

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