The Impact of Residual Stress on Resonating Piezoelectric Devices - XRD data

Published: 24 August 2020| Version 1 | DOI: 10.17632/j4xtbtpt3p.1
Contributor:
Glenn Ross

Description

Repository of XRD data from pMUT devices

Files

Institutions

Aalto-yliopisto

Categories

X-Ray Diffraction

License