The Impact of Residual Stress on Resonating Piezoelectric Devices - XRD data
Published: 24 August 2020| Version 1 | DOI: 10.17632/j4xtbtpt3p.1
Contributor:
Glenn RossDescription
Repository of XRD data from pMUT devices
Files
Institutions
Aalto-yliopisto
Categories
X-Ray Diffraction