Transmission spectrum and Spectroscopic Ellipsometry data of JGS2-fused Silica

Published: 10 March 2026| Version 4 | DOI: 10.17632/jz2wc5rzyx.4
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Description

This data set describes the transmission spectrum and spectroscopic ellipsometry data of JGS2-fused Silica substrate.

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Steps to reproduce

The Fused Silica substrate has a dimensions 20mmx20mmx1mm. The surface RMS roughness is less than 1 nm. The refractive index and extinction coefficient spectrum of the substrate is measured with a J.B. Woolam spectroscopic ellipsometer at three incident angles 65 deg, 70 deg and 75 deg. Then the substrate is set in path of a dual beam UV-VIS spectrometer: Agilent Cary 5000 for transmission spectrum measurement.

Institutions

  • Woxsen School of Business
    Andhra Pradesh, Hyderabad

Categories

Optical Spectroscopy

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