Techno stress and Coping strategies

Published: 22 Jan 2020 | Version 4 | DOI: 10.17632/jz42th6t4t.4
Contributor(s):

Description of this data

Techno Stress and Coping Strategies

Experiment data files

  • New folder
    Cite

Steps to reproduce

Ready Data set with all necessary steps taken for statistical analysis
Item code "coping strategies" (AVD) represents avoidance, (PS) represents problem solving, (RC) represents religious coping, and (SS) represent seeking support each measure has 2 items each.
Item code (Psy) represents positive psychology) and (SC) represents social capital, both measures have 3 items each.
Techno stress has three sub measure (TCX) technology complexity, (TOL) technology overload, (TUC) technology uncertainty, all have 3 items each. All variables were averaged to create the new variable

Latest version

  • Version 4

    2020-01-22

    Published: 2020-01-22

    DOI: 10.17632/jz42th6t4t.4

    Cite this dataset

    Abbas, Ansar; Ekowati, Dian; Eliyana, Anis; Saud, Muhammad (2020), “Techno stress and Coping strategies”, Mendeley Data, v4 http://dx.doi.org/10.17632/jz42th6t4t.4

Statistics

Views: 114
Downloads: 21

Previous versions

Compare to version

Institutions

Universitas Airlangga - Kampus B

Categories

Business, Business Administration

Licence

CC BY 4.0 Learn more

The files associated with this dataset are licensed under a Creative Commons Attribution 4.0 International licence.

What does this mean?
You can share, copy and modify this dataset so long as you give appropriate credit, provide a link to the CC BY license, and indicate if changes were made, but you may not do so in a way that suggests the rights holder has endorsed you or your use of the dataset. Note that further permission may be required for any content within the dataset that is identified as belonging to a third party.

Report