ATR-FTIR spectroscopy raw data for YIG and BiIG thin films on SiO₂/Si substrates

Description

This dataset contains raw ATR-FTIR spectroscopy data for yttrium iron garnet (YIG) and bismuth iron garnet (BiIG) thin films deposited on silicon substrates with a SiO₂ buffer layer by ion-beam sputtering. IR spectra were recorded on a Nicolet iS50 Fourier-transform spectrometer (Thermo Fisher Scientific, USA) in the attenuated total reflection (ATR) mode using a built-in iS50 ATR accessory equipped with a diamond crystal. The sample was pressed against the working crystal of the accessory. The measurements were performed in the spectral range of 4000–400 cm⁻¹ (2.5–25 µm). The first column is the wave number (cm⁻¹), the second column is the optical density (a.u.)

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