Nanoscale Residual Stress Depth Profiling by Focused Ion Beam Milling and Eigenstrain Analysis
Published: 20 February 2018| Version 1 | DOI: 10.17632/vb78jgkw4z.1
Contributors:
Alexander Korsunsky, , , Description
FIB-DIC multiple micro-ring-core milling strain data
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Categories
Materials Science, Microscopy, Electron Microscopy, Finite Element Modeling, Surface Engineering, Residual Stress, Focused Ion Beam