Application of four-segments annular Silicon drift detector for 3-D surface topography reconstruction by micro-PIXE
Published: 14 May 2023| Version 1 | DOI: 10.17632/wc392364jc.1
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Ebrahim Gholami HatamDescription
These are the dataset of the Application of four-segments annular Silicon drift detector for 3-D surface topography reconstruction by micro-PIXE measurements performed at the microanalytical center at Josef Stefan Institute at Ljubljana, Slovenia.
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