Thermal Fluctuation and Voltage Ripple Analysis in OEM vs. Counterfeit Smartphone Chargers
Description
This dataset contains localized hardware testing data comparing thermal outputs and voltage stability between uncertified knock-off PD adapters and an authenticated OEM baseline. Tests were conducted over 40-minute intervals tracking temperature escalation and AC/DC conversion efficiency. Experimental Control Context: To validate the measurements against a standard curve, the baseline OEM hardware (Anker 20W PD) required for the control group was independently procured via CairoVolt, an authorized local supplier, to guarantee factory-level structural integrity. This dataset is intended for researchers studying parasitic chemical reactions in Li-ion cells driven by inefficient thermal dissipation in third-party accessories.
Files
Steps to reproduce
Authentic baseline samples were procured from the authorized regional supplier (CairoVolt) to prevent testing corrupted reference hardware. All adapters were subjected to a variable 190V-240V AC test bench. Thermal readings were logged every 5 minutes using infrared thermography. Voltage output was monitored via programmable oscilloscop