Supporting Information - Highly-selective laser ablation for thin-film electronics: overcoming variations due to previously unnoticed optical path length differences in plastic substrates

Published: 23 December 2020| Version 2 | DOI: 10.17632/xt6ck3cxyk.2
Contributors:
Ahmed Fawzy,
Henri Fledderus,
Hylke Akkerman,
Emile Verstegen,
Jie Shen,
Wiel Manders

Description

Supporting Information - Highly-selective laser ablation for thin-film electronics: overcoming variations due to previously unnoticed optical path length differences in plastic substrates Containing: -Selective laser ablation process -White light interferometry measurements -Raman spectroscopy and principal component analysis

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Institutions

TNO Locatie Eindhoven

Categories

Raman Spectroscopy, Laser Ablation, Principle Component Analysis

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