Supporting Information - Highly-selective laser ablation for thin-film electronics: overcoming variations due to previously unnoticed optical path length differences in plastic substrates
Published: 23 December 2020| Version 2 | DOI: 10.17632/xt6ck3cxyk.2
Contributors:
Ahmed Fawzy,
Henri Fledderus,
Hylke Akkerman,
Emile Verstegen,
Jie Shen,
Wiel Manders
Description
Supporting Information - Highly-selective laser ablation for thin-film electronics: overcoming variations due to previously unnoticed optical path length differences in plastic substrates Containing: -Selective laser ablation process -White light interferometry measurements -Raman spectroscopy and principal component analysis
Files
Institutions
TNO Locatie Eindhoven
Categories
Raman Spectroscopy, Laser Ablation, Principle Component Analysis