Raw data: Characterization of nanocrystallised multilayered metallic materials produced by the SMAT followed by constrained compression
Published: 16 July 2018| Version 1 | DOI: 10.17632/z488ggd2r8.1
Contributor:
Szymon BajdaDescription
Optical, SEM, TEM images. EDS analysis.
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Akademia Gorniczo-Hutnicza imienia Stanislawa Staszica w Krakowie
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