Solid State Communications

At room temperature, the crystal structure of the samples was detected by X-ray diffraction (XRD). Using an Ar+ excitation source (λ= 633nm) measured Raman spectra with a liquid-nitrogen-cooled device. Superconductor quantum interference device magnetometer (SQUID) was used to characterize the relationship between the temperature(T) dependence of magnetization(M) with the temperature ranging from 5 K to 300 K and the external magnetic field of 10KOe. At low temperature (5 K), the hysteresis loops (M-H loop) of the samples were measured with an applied magnetic field range was from -50kOe to -50kOe.